System Equipments
Semiconductor Aging Testing Equipment
The equipment is semiconductor aging testing equipment to full-automatically execute burn-in processing and data measurement/judgment/analytical processing and also has tester function as well as temperature accelerating testing. Semiconductor Aging Testing Equipment
TabView Example - Basic From Existing Markup
    Ultra-precise measuring techniques to detect variation of 10-12 ampere.
    A total system from temperature control to data processing.
    Completed automatic system by using up-dated computer techniques.
    A full line up covering from laboratory uses to on-line production.
    Calorie meter part Compressor driving equipment
    Refrigerating cycle
    Compressor temperature chamber
    Evaporator temperature chamber
    Measuring part Controller
    Input scanner
    Communications interface
    Personal computer
    Peripheral part Chiller unit
    Cooling water bath
    Testing part Exclusive test fixtures corresponding to various devices are prepared, and various testing baths are prepared corresponding to lot sizes and point number.
    Temperature monitoring of testing bath Temperature pattern control and stability monitoring interlocking to testing modes are executed.
    Measuring control processing Bias applied and voltage/current/light output to device are accurately executed and measured values are transferred to a personal computer.
    Data processing Interactive settings for aging testing are executed through a personal computer and sensitivity is automatically adjusted by a personal computer. In addition, measured values are stored into a disk and analytical data can be shown on a CRT as figure or table format and outputted.
    Host computer communications Enormous quantity of data got from again processing are transferred to a host computer, and storage. Management and high grade of analytical processing can be executed.
    Opto-electronics devise Laser diode (short wave, long wave), Photo diode, Opto-semiconductor module, Light emitting diode, LED dot display, EL display device
    Temperature monitoring of testing bath Zener diode, Tantalum capacitor, Mylar capacitor, IC card, VLSI, Transistor, MOS/FET, High frequency transistor, Thermistor, Peltier element, Switching element, Superconductivity element, Hole element
    Measuring control processing Bias applied and voltage/current/light output to device are accurately executed and measured values are transferred to a personal computer.
    Electronic parts Interactive settings for aging testing are executed through a personal computer and sensitivity is automatically adjusted by a personal computer. In addition, measured values are stored into a disk and analytical data can be shown on a CRT as figure or table format and outputted.
    Instrument Instrument for the universe, Power module
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